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Volumn 42, Issue 9, 1998, Pages 1631-1640

Back surface field effects in the 17.3% efficient n-type dendritic web silicon solar cells

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION IN SOLIDS; NUMERICAL ANALYSIS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DOPING;

EID: 0032163659     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(98)00096-3     Document Type: Article
Times cited : (14)

References (16)
  • 1
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    • IEEE, New York
    • Mandelkorn, J. and Lamneck, J. H., Simplified fabrication of back surface electric field silicon cells and novel characteristics of such cells, in: Proc. 9th IEEE Photovoltaics Specialists Conf., IEEE, New York, 1972.
    • (1972) Proc. 9th IEEE Photovoltaics Specialists Conf.
    • Mandelkorn, J.1    Lamneck, J.H.2
  • 5
    • 0022798112 scopus 로고
    • Simultaneous junction formation using a directed energy light source
    • Campbell, R. B. and Meier, D. L., Simultaneous junction formation using a directed energy light source, J. Electrochem. Soc., 1986, 133, 2210-2211.
    • (1986) J. Electrochem. Soc. , vol.133 , pp. 2210-2211
    • Campbell, R.B.1    Meier, D.L.2
  • 7
    • 0021424979 scopus 로고
    • Design, fabrication, and analysis of 17-18-percent efficient surface-passivated silicon solar cells
    • Rohatgi, A. and Rai-Choudhury, P., Design, fabrication, and analysis of 17-18-percent efficient surface-passivated silicon solar cells, IEEE Trans. Electron. Dev., 1984, 31, 596-601.
    • (1984) IEEE Trans. Electron. Dev. , vol.31 , pp. 596-601
    • Rohatgi, A.1    Rai-Choudhury, P.2
  • 8
    • 0022957473 scopus 로고
    • Measurement of electron lifetime, electron mobility and band-gap narrowing in heavily doped p-type silicon
    • Swirhun, S. E., Kwark, Y. -H. and Swanson, R.M., Measurement of electron lifetime, electron mobility and band-gap narrowing in heavily doped p-type silicon, IEDM Tech. Dig., 1986, p. 24.
    • (1986) IEDM Tech. Dig. , pp. 24
    • Swirhun, S.E.1    Kwark, Y.H.2    Swanson, R.M.3
  • 9
    • 0342953430 scopus 로고
    • Surface recombination velocity and energy bandgap narrowing of highly doped N-type silicon
    • H. S. Stephens and Associates, U.K.
    • Cuevas, A., Basore, P. A., Giroult-Matlakowski, G. and Dubois, C., Surface recombination velocity and energy bandgap narrowing of highly doped N-type silicon, in 13th European Photovoltaic Solar Energy Conference, H. S. Stephens and Associates, U.K., 1995, pp. 337-342.
    • (1995) 13th European Photovoltaic Solar Energy Conference , pp. 337-342
    • Cuevas, A.1    Basore, P.A.2    Giroult-Matlakowski, G.3    Dubois, C.4
  • 10
    • 0026820842 scopus 로고
    • Unified apparent bandgap narrowing in n- And p-type silicon
    • Klaasen, D. B., Slotboom, J. W. and de Graaf, H. C., Unified apparent bandgap narrowing in n- and p-type silicon, Solid-State Electron., 1992, 35, 125-129.
    • (1992) Solid-State Electron. , vol.35 , pp. 125-129
    • Klaasen, D.B.1    Slotboom, J.W.2    De Graaf, H.C.3
  • 11
    • 0001078652 scopus 로고
    • Auger coefficients for highly doped and highly excited silicon
    • Dziewior, J. and Schmid, W., Auger coefficients for highly doped and highly excited silicon, Appl. Phys. Lett., 1977, 31, 346-348.
    • (1977) Appl. Phys. Lett. , vol.31 , pp. 346-348
    • Dziewior, J.1    Schmid, W.2
  • 12
    • 0025692325 scopus 로고
    • Minority carrier transport parameters in degenerate n-type silicon
    • Wang, C. H. and Neugroschel, A., Minority carrier transport parameters in degenerate n-type silicon, IEEE Trans. Electron. Dev., 1990, 11, 576-578.
    • (1990) IEEE Trans. Electron. Dev. , vol.11 , pp. 576-578
    • Wang, C.H.1    Neugroschel, A.2
  • 13
    • 0018997786 scopus 로고
    • The open-circuit voltage of back-surface-field (BSF) p-n junction solar cells in concentrated sunlight
    • Wu, C.-Y. and Shen, W.-Z., The open-circuit voltage of back-surface-field (BSF) p-n junction solar cells in concentrated sunlight, Solid-State Electron., 1980, 23, 209-216.
    • (1980) Solid-State Electron. , vol.23 , pp. 209-216
    • Wu, C.-Y.1    Shen, W.-Z.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.