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Volumn 414, Issue 1-2, 1998, Pages 221-235

Growth morphology and electronic structure of Na films on Si(111)-(7 × 7) and Si(111)-Na(3 × 1)

(4) Paggel, J J a,b Neuhold, G a Haak, H a Horn, K a

a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT (Germany)

Author keywords

Alkali metals; Low energy electron diffraction (LEED); Low index single crystal surfaces; Metal semiconductor interfaces; Photoelectron spectroscopy; Scanning tunneling microscopy; Semiconducting films; Semiconducting surfaces; Silicon

Indexed keywords

CRYSTAL ORIENTATION; ELECTRONIC STRUCTURE; FILM GROWTH; MORPHOLOGY; PHOTOEMISSION; SEMICONDUCTING SILICON; SEMICONDUCTOR METAL BOUNDARIES; SINGLE CRYSTALS; SODIUM; SURFACE PHENOMENA; SURFACE STRUCTURE; THIN FILMS;

LOW INDEX SINGLE CRYSTALS; SURFACE RECONSTRUCTIONS;

METALLIC FILMS;

EID: 0032163514 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(98)00514-7 Document Type: Article

Times cited : (23)

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