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Volumn 412-413, Issue , 1998, Pages 631-638

Surface composition of the phases formed by solid state reaction at the Cr/ZnO(0001) interface studied by low energy ion scattering and X-ray photoelectron spectroscopy

(6) Spolveri, Irene a Atrei, Andrea b Cortigiani, Brunetto a Bardi, Ugo a Santucci, Alessandro c Ghisletti, Danila c

a UNIVERSITY OF FLORENCE (Italy)

b UNIVERSITY OF SIENA (Italy)

c Snamprogetti SpA (Italy)

Author keywords

Chromium; Compound formation; Epitaxy; Low energy ion scattering; Spinel; X ray photoelectron spectroscopy; Zinc oxide

Indexed keywords

ANNEALING; CHROMIUM; DEPOSITION; ELECTRON DIFFRACTION; EPITAXIAL GROWTH; FILM GROWTH; METALLIC FILMS; OXIDATION; PHASE COMPOSITION; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDE;

LOW ENERGY ION SCATTERING (LEIS); SOLID STATE REACTION; X RAY PHOTOELECTRON DIFFRACTION (XPD);

INTERFACES (MATERIALS);

EID: 0032162605 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(98)00497-X Document Type: Article

Times cited : (13)

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