Structural characterization of Langmuir-Blodgett films by X-ray diffraction in transmission geometry

Thin Solid Films

Volumn 330, Issue 2, 1998, Pages 157-160

  Yang, Bin ^a,b   Qiao, Ying ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b UNIVERSITY OF CHICAGO   (United States)

Author keywords

Langmuir Blodgett films; Lattice parameters; X ray diffraction

Indexed keywords

X RAY DIFFRACTION IN TRANSMISSION GEOMETRY METHOD;

CAPILLARITY; CARRIER CONCENTRATION; DEPOSITION; LATTICE CONSTANTS; MOLECULAR STRUCTURE; MULTILAYERS; X RAY DIFFRACTION ANALYSIS;

LANGMUIR BLODGETT FILMS;

EID: 0032157033     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)00540-9     Document Type: Article

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