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Volumn 21, Issue 3, 1998, Pages 478-491
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High frequency measurements and simulations on wire-bonded modules on the sequential build-up boards (SBU's)
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Author keywords
Cross talk; FR 4; Impedance matching; SBU; Stray capacitance; Wire bonding
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Indexed keywords
CAPACITANCE;
COMPUTER SIMULATION;
CROSSTALK;
DIELECTRIC LOSSES;
ELECTRIC FREQUENCY MEASUREMENT;
FINITE DIFFERENCE METHOD;
IMPEDANCE MATCHING (ELECTRIC);
SEMICONDUCTOR DEVICE TESTING;
SEQUENTIAL BUILD-UP (SBU) BOARDS;
PRINTED CIRCUIT BOARDS;
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EID: 0032156985
PISSN: 10709886
EISSN: None
Source Type: Journal
DOI: 10.1109/95.725212 Document Type: Article |
Times cited : (7)
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References (8)
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