Calculation of the aligned fraction in polycrystalline samples with preferred orientation

Solid State Communications

Volumn 108, Issue 5, 1998, Pages 271-273

  Shaked, Hagai ^a  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

C. X ray scattering; E. neutron scattering

Indexed keywords

ANISOTROPY; COMPUTATIONAL METHODS; CRYSTAL ORIENTATION; NEUTRON SCATTERING; X RAY SCATTERING;

RIETVELD REFINEMENT;

POLYCRYSTALLINE MATERIALS;

EID: 0032156091     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(98)00372-X     Document Type: Article

References (5)

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4. Leventouri, T., Superlatt. Microstr., 21A, 1997, 207.
5. 2 - 1) sin 2θ).