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Volumn 39-40, Issue , 1998, Pages 493-497

Internal stress control of boron thin film

Author keywords

[No Author keywords available]

Indexed keywords

BORON; COMPRESSIVE STRESS; DEPOSITION; EVAPORATION; HYDROGEN; ION BOMBARDMENT; PROTECTIVE COATINGS; RADIATION EFFECTS; RESIDUAL STRESSES; STRESS ANALYSIS; STRESS RELIEF; TENSILE STRESS;

EID: 0032156087     PISSN: 09203796     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0920-3796(98)00251-8     Document Type: Article
Times cited : (10)

References (12)
  • 3
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    • Effects of boronization of the first wall in TFTR
    • H.F. Dylla, M.G. Bell, R.J. Hawryluk, et al., Effects of boronization of the first wall in TFTR, J. Nucl. Mater. 176/177 (1990) 337.
    • (1990) J. Nucl. Mater. , vol.176-177 , pp. 337
    • Dylla, H.F.1    Bell, M.G.2    Hawryluk, R.J.3
  • 5
    • 0027628351 scopus 로고
    • Initial boronization of JT-60U tokamak using decaborane
    • M. Saidoh, N. Ogiwara, M. Shimada, et al., Initial boronization of JT-60U tokamak using decaborane, Jpn. J. Appl. Phys. 32 (1993) 3276.
    • (1993) Jpn. J. Appl. Phys. , vol.32 , pp. 3276
    • Saidoh, M.1    Ogiwara, N.2    Shimada, M.3
  • 7
    • 0000256646 scopus 로고
    • Elastic and viscoelastic analysis of stress in thin films
    • H.C. Liu, S.P. Murarka, Elastic and viscoelastic analysis of stress in thin films, J. Appl. Phys. 72 (1992) 3458.
    • (1992) J. Appl. Phys. , vol.72 , pp. 3458
    • Liu, H.C.1    Murarka, S.P.2
  • 8
    • 0024640955 scopus 로고
    • Note on the origin of intrinsic stress in films deposited via evaporation and sputtering
    • F.M. D'Heurle, J.M.E. Harper, Note on the origin of intrinsic stress in films deposited via evaporation and sputtering, Thin Solid Films 171 (1989) 81.
    • (1989) Thin Solid Films , vol.171 , pp. 81
    • D'Heurle, F.M.1    Harper, J.M.E.2
  • 9
    • 0001254055 scopus 로고
    • Dependence of thin-film microstructure on deposition rate by means of a computer simulation
    • K.H. Müller, Dependence of thin-film microstructure on deposition rate by means of a computer simulation, J. Appl. Phys. 58 (1985) 2573.
    • (1985) J. Appl. Phys. , vol.58 , pp. 2573
    • Müller, K.H.1
  • 10
    • 36549102302 scopus 로고
    • Stress and micro structure of sputter-deposited thin films: Molecular dynamics investigations
    • K.H. Müller, Stress and micro structure of sputter-deposited thin films: molecular dynamics investigations, J. Appl. Phys. 62 (1987) 1796.
    • (1987) J. Appl. Phys. , vol.62 , pp. 1796
    • Müller, K.H.1
  • 11
    • 21544431995 scopus 로고
    • An intrinsic stress scaling law for polycrystalline thin films prepared by ion beam sputtering
    • H. Windischmann, An intrinsic stress scaling law for polycrystalline thin films prepared by ion beam sputtering, J. Appl. Phys. 62 (1987) 1800.
    • (1987) J. Appl. Phys. , vol.62 , pp. 1800
    • Windischmann, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.