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Volumn 107, Issue 2-3, 1998, Pages 197-199

Structural and electrical properties of cathodic sputtered thin chromium films

Author keywords

Cathodic sputtering; Chromium films

Indexed keywords

CHROMIUM; COMPOSITION; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC PROPERTIES; SPUTTER DEPOSITION; STRUCTURE (COMPOSITION); TEMPERATURE; THICKNESS MEASUREMENT; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 0032155458     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(98)00583-0     Document Type: Article
Times cited : (13)

References (4)
  • 1
    • 0001886644 scopus 로고
    • Reactive sputtering
    • in: M.H. Francombe, J.L. Vossen (Eds.) Academic Press, New York
    • W.D. Westwood, Reactive sputtering, in: M.H. Francombe, J.L. Vossen (Eds.), Physics of Thin Films, Academic Press, New York, 1989, Vol. 14, p. 1.
    • (1989) Physics of Thin Films , vol.14 , pp. 1
    • Westwood, W.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.