Evaluation of atomic grain boundary structure in alumina by molecular orbital method

Journal of the Ceramic Society of Japan

Volumn 106, Issue 9, 1998, Pages 888-892

  Watanabe, Tsuyoshi ^a   Ikuhara, Yuichi ^a   Sakuma, Taketo ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Alumina; Atomic structure; DV X method; Grain boundary; Molecular orbital method

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; ELECTRON MICROSCOPY; GRAIN BOUNDARIES;

ATOMIC GRAIN BOUNDARY STRUCTURE; BOND OVERLAP POPULATION; COULOMB FORCE; INTERPLANAR SPACING; MARDELLUNG POTENTIAL; MOLECULAR ORBITAL METHOD; NET CHARGE;

ALUMINA;

EID: 0032154913     PISSN: 09145400     EISSN: None     Source Type: Journal    
DOI: 10.2109/jcersj.106.888     Document Type: Review

References (9)

1. F. R. Chen, C. C. Chu, J. Y. Wang and L. Chang, Phil. Mag., A72, 529-44 (1995).
2. T. Höche, P. R. Kenway, H.-J. Kleebe and M. Rühle, J. Am. Ceram. Soc., 77, 339-48 (1994).
3. Y. Takigawa, Y. Ikuhara and T. Sakuma, Mater, Sci. Forum, 243-245, 425-30 (1997).
4. M. Kohyams, and R. Yamamota, Phys. Rev., 850, 8502-22 (1994).
5. P. Keblinski, S. R. Phillpot, D. Wolf and H. Gleiter, Acto, Mater., 46, 987-98 (1997).
6. I. Tanaka, J. Kawai and H. Adachi, Solid State Commun., 93, 533-36 (1995).
7. Y. Ikuhara, Y. Sugawara, I. Tanaka and P. Piroua Interface Science, 5, 5-16 (1997).
8. J. Guo, D. E. Ellis and D. J. Lam, Phys. Rev., 845, 13647-56 (1992).