An Inhomogeneous Grain Boundary Composition in Silicon Nitride Ceramics as Revealed by 300 kV Field Emission Analytical Electron Microscopy

Journal of Materials Synthesis and Processing

Volumn 6, Issue 5, 1998, Pages 359-365

  Bando, Yoshio ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Analytical electron microscopy; Grain boundary composition; Lattice imaging; energy dispersive x ray spectroscopy; Silicon nitride

Indexed keywords

ADDITIVES; CRYSTAL LATTICES; ELECTRON MICROSCOPES; ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; NEODYMIUM COMPOUNDS; SILICON NITRIDE; SINTERING; YTTRIUM COMPOUNDS;

NEODYMIUM OXIDE; YTTRIUM OXIDE;

CERAMIC MATERIALS;

EID: 0032154536     PISSN: 10647562     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1022659412549     Document Type: Article

References (3)

1. K. H. Jack, J. Br. Ceram. Soc., 72, 376 (1973).
2. A. Tsuge, K. Nishida, and M. Komatsu, J. Am. Ceram. Soc., 58, 323 (1975).
3. F. F. Lange, J. Am. Ceram. Soc. 65, C-23 (1982).