Microanalyses of crystalline ZrO2-Y2O3 films irradiated by Ar ion and electron beams

Surface and Coatings Technology

Volumn 107, Issue 2-3, 1998, Pages 168-171

  Zhang, Hailong ^a   Wang, D Z ^a   Huang, N K ^a  

^a SICHUAN UNIVERSITY   (China)

Author keywords

Ion and electron beams; Raman spectroscopy; ZrO2 Y2O3 films

Indexed keywords

ARGON; CRYSTAL STRUCTURE; ELECTRON IRRADIATION; FILM PREPARATION; ION BOMBARDMENT; MAGNETRON SPUTTERING; PHASE TRANSITIONS; RAMAN SPECTROSCOPY; SPUTTER DEPOSITION; X RAY DIFFRACTION ANALYSIS; YTTRIUM; ZIRCONIA;

ARGON IONS; ELECTRON BEAM HEATING; MICROANALYSES; PHASE STRUCTURE;

CERAMIC COATINGS;

EID: 0032154153     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(98)00643-4     Document Type: Article

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