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Volumn 30, Issue 3-4, 1998, Pages 299-304

Novel quantitative non-destructive testing method for composite structures

Author keywords

Composite structure; Phase shifting; QNDT (quantitative non destructive testing); Shearing speckle; Thermograph

Indexed keywords

COMPOSITE STRUCTURES; CRACKS; DELAMINATION; FAILURE ANALYSIS; HEAT RESISTANCE; PHASE SHIFT; SPECKLE; TEMPERATURE DISTRIBUTION; THERMOGRAPHY (TEMPERATURE MEASUREMENT);

EID: 0032154057     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0143-8166(98)00020-7     Document Type: Article
Times cited : (13)

References (6)
  • 1
    • 22244476937 scopus 로고
    • Detection of flaw honeycomb sandwich constructions by infrared
    • Shiratoriitc M. Detection of flaw honeycomb sandwich constructions by infrared. Thermography ATEM '93, 1993.
    • (1993) Thermography ATEM '93
    • Shiratoriitc, M.1
  • 2
    • 0030216710 scopus 로고    scopus 로고
    • Infrared thermography and its application in the NDT of sandwich structures
    • Qin YW, Bao NK. Infrared thermography and its application in the NDT of sandwich structures. Optics and Laser in Engineering 1996;25:205-21.
    • (1996) Optics and Laser in Engineering , vol.25 , pp. 205-221
    • Qin, Y.W.1    Bao, N.K.2
  • 3
    • 20444389736 scopus 로고
    • A study of electronics shearing speckle technique
    • Qin, YW, Wang JQ, Ji XH. A study of electronics shearing speckle technique. Proc. SPIE 1991;1554A:739-46.
    • (1991) Proc. SPIE , vol.1554 A , pp. 739-746
    • Qin, Y.W.1    Wang, J.Q.2    Ji, X.H.3
  • 4
    • 22244437130 scopus 로고
    • Rapid evaluation of hermetic seals of microelectronic package using digital shearograph
    • Hung YY, and Shi, DH. Rapid evaluation of hermetic seals of microelectronic package using digital shearograph. Proc. of the SEM Spring Conference and Exhibit, 1995:692-7.
    • (1995) Proc. of the SEM Spring Conference and Exhibit , pp. 692-697
    • Hung, Y.Y.1    Shi, D.H.2
  • 5
    • 0010218240 scopus 로고
    • Electronic speckle pattern interferometer with a polarization phase-shifting technique
    • Jin GC, Tang SH. Electronic speckle pattern interferometer with a polarization phase-shifting technique. Opt. Eng. 1992;31:857-60.
    • (1992) Opt. Eng. , vol.31 , pp. 857-860
    • Jin, G.C.1    Tang, S.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.