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Physica Status Solidi (A) Applied Research

Volumn 168, Issue 2, 1998, Pages

Electrical noise in nanocrystalline films

(5) Ochs, E a Seeger, A a Stoll, H a Kiss, L b Soderlund J b

a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS (Germany)

b UPPSALA UNIVERSITY (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ANNEALING; CURRENT DENSITY; ELECTRIC CURRENT MEASUREMENT; GRAIN BOUNDARIES; NANOSTRUCTURED MATERIALS; STRESS RELAXATION; THERMAL NOISE;

INVERSE DEBYE FREQUENCY;

METALLIC FILMS;

EID: 0032141742 PISSN: 00318965 EISSN: None Source Type: Journal
DOI: 10.1002/(SICI)1521-396X(199808)168:23.0.CO;2-3 Document Type: Article

Times cited : (5)

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