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Volumn 10, Issue 12, 1998, Pages 942-946
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Tin sulfide mesh: AFM imaging of lamellae and mesopores
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL DEFECTS;
CRYSTAL ORIENTATION;
CRYSTAL SYMMETRY;
GRAPHITE;
IMAGE RECORDING;
IMAGING TECHNIQUES;
POROUS MATERIALS;
SUBSTRATES;
SURFACE STRUCTURE;
TIN COMPOUNDS;
TIN SULFIDE;
THERMOTROPIC LIQUID CRYSTALS;
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EID: 0032141531
PISSN: 09359648
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1521-4095(199808)10:12<942::AID-ADMA942>3.0.CO;2-S Document Type: Article |
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Times cited : (15)
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References (11)
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