Design of a built-in current sensor for IDDQ testing

IEEE Journal of Solid-State Circuits

Volumn 33, Issue 8, 1998, Pages 1266-1272

  Kim, Jeong Beom ^a   Hong, Sung Je ^b   Kim, Jong ^b  

^a Chungbuk National University   (South Korea)

^b Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

Built in current sensor; Current testing; IDDQ testing; Reliability; Testing

Indexed keywords

DESIGN; FABRICATION; PERFORMANCE; RELIABILITY; SENSORS; TESTING;

CURRENT SENSORS;

VLSI CIRCUITS;

EID: 0032141150     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.705368     Document Type: Article

References (14)

1. W. Maly, "Realistic fault modeling for VLSI testing," in Proc. Design Automation Conf., 1987, pp. 173-180.
2. F. J. Ferguson and J. P. Shen, "A CMOS fault extractor for inductive fault analysis," IEEE Trans. Computer-Aided Design, vol. 7, pp. 1181-1194, Nov. 1988.
3. T. M. Storey and W. Maly, "CMOS bridging faults detection," in Proc. Int. Test Conf., Sept. 1990, pp. 842-851.
4. DDQ testing on a static RAM," in Proc. Int. Test Conf., Sept. 1990, pp. 929-937.
5. F. Vargas and N. Nicolaidis, "SEU-tolerant SRAM design based on current monitoring," in Proc. 24th Int. Symp. Fault-Tolerant Comput., June 1994, pp. 106-115.
6. DDQ testing on a custom automotive IC," IEEE J. Solid-State Circuits, vol. 30, pp. 295-299, Mar. 1995.
7. P. Nigh and W. Maly, "A self-testing ALU using built-in current sensing," in Proc. IEEE Custom Integrated Circuit Conf., 1989, pp. 22.1.1-22.1.4.
8. M. Favalli, P. Olivo, M. Damiani, and B. Ricco, "Novel design for testability schemes for CMOS IC's," IEEE J. Solid-State Circuits, vol. 25, pp. 1239-1246, Oct. 1990.
9. DD testing," in Proc. Int. Test Conf., Sept. 1987, pp. 316-321.
10. ddq Testing for CMOS VLSI. Boston, MA: Artech House, 1995.
11. W. Maly and M. Patyra, "Built-in current testing," IEEE J. Solid-State Circuits, vol. 27, pp. 425-128, Mar. 1992.
12. Y. Miura and K. Kinoshita, "Circuit design for built-in current testing," in Proc. Int. Test Conf., Nov. 1992, pp. 873-881.
13. T. L. Shen, J. C. Daly, and J. C. Lo, "A 2-ns detecting time, 2-μm CMOS built-in current sensing circuit," IEEE J. Solid-State Circuits, vol. 28, pp. 72-77, Jan. 1993.
14. DDQ testing," IEEE Trans. Computer-Aided Design, Vol. 3, pp. 302-310, June 1995.