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Volumn 14, Issue 8, 1998, Pages 12-
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Adding "intelligence" to field-emission displays
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC CURRENT MEASUREMENT;
ION IMPLANTATION;
MOSFET DEVICES;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR DEVICE STRUCTURES;
TRANSISTOR TRANSISTOR LOGIC CIRCUITS;
VOLTAGE MEASUREMENT;
DRAIN CURRENT;
EMISSION CURRENT;
FIELD EMISSION DISPLAYS;
FIELD EMITTER ARRAYS;
DISPLAY DEVICES;
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EID: 0032141045
PISSN: 03620972
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (9)
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References (0)
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