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Volumn 54, Issue 1-4, 1998, Pages 363-368
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Assessment of diffusion processes in thin films
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Author keywords
Diffusion processes; Thin films
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
DIFFUSION IN SOLIDS;
GRAIN BOUNDARIES;
HIGH TEMPERATURE EFFECTS;
LIGHT ABSORPTION;
LIGHT EMISSION;
MATHEMATICAL MODELS;
SOLAR ABSORBERS;
SPUTTERING;
SUBSTRATES;
THIN FILMS;
VACUUM;
DEPTH PROFILING;
THIN SPECTRALLY SELECTIVE SOLAR ABSORBER COATINGS;
OPTICAL COATINGS;
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EID: 0032140905
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0927-0248(98)00087-7 Document Type: Article |
Times cited : (1)
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References (4)
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