Transmission electron microscopy and x-ray structural investigation of La0.7Ca0.3MnO3 thin films

Journal of Materials Research

Volumn 13, Issue 8, 1998, Pages 2161-2169

  Li, Y H ^a   Thomas, K A ^a   De Silva, P S I P N ^a   Cohen, L F ^a   Goyal, A ^b   Rajeswari, M ^c   Mathur, N D ^b   Blamire, M G ^b   Evetts, J E ^b   Venkatesan, T ^c   MacManus Driscoll, J L ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM COMPOUNDS; CRYSTAL STRUCTURE; LANTHANUM COMPOUNDS; MAGNETORESISTANCE; MANGANESE COMPOUNDS; OXIDES; PEROVSKITE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

MIXED OXIDES;

THIN FILMS;

EID: 0032140402     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1998.0302     Document Type: Article

References (37)

1. C. N. R. Rao, A. K. Cheetham, and R. Mahesh, Chem. Mater. 8, 2421 (1996).
2. K. Chahara, T. Ohno, M. Kasai, and Y. Kozono, Appl. Phys. Lett. 63, 1990 (1993).
3. S. Jin, T. H. Tiefel, M. McCormack, R. A. Fastnacht, R. Ramesh, and L. H. Chen, Science 264, 413 (1994).
4. A. Urushibara, Y. Moritomo, T. Arima, A. Asamitsu, G. Kido, and Y. Tokura Phys. Rev. B 51 (20), 14 103 (1995).
5. J. F. Mitchell, D. N. Argyriou, C. D. Potter, D. G. Hinks, J. D. Jorgensen, and S. D. Bader, Phys. Rev. B 54 (9), 6172 (1996).
6. A. J. Millis, P. B. Littlewood, and B. I. Shraiman, Phys. Rev. Lett. 74, 5144 (1995).
7. A. P. Ramirez, P. Schiffer, S-W. Cneong, C. H. Chen, W. Bao, T. T. M. Palstra, P. L. Gammel, D. J. Bishop, and B. Zegarski, Phys. Rev. Lett. 76 (197), 3188 (1996).
8. G. Zhao, K. Conder, H. Keller, and K. A. Muller, Nature (London) 381, 676 (1996).
9. M. C. Martin, G. Shirane, Y. Endoh, K. Hirota, Y. Morimoto, and Y. Tokura, Phys. Rev. B 53 (21), 14285 (1996).
10. L. M. R. Martinez and J. P. Attfield, Phys. Rev. B 54, 1 (1996).
11. A. Asamitsu, Y. Morimoto, Y. Tomioka, T. Arima, and Y. Tokura, Nature (London) 373, 407 (1995).
12. Epitaxial Oxide Thin Films II, edited by J. S. Speck, D. K. Fork, R. M. Wolf, and T. Shiosaki (Mater. Res. Soc. Symp. Proc. 401, Pittsburgh, PA, 1996), p. 531.
13. P. G. Radaelli, M. Marezio, H. Y. Hwang, and S-W. Cheong, J. Solid State Chem. 122, 444 (1996).
14. R. Mahendran, S. K. Tewari, A. K. Raychauduri, and T. V. Ramakrishnan, Phys. Rev. B 53 (6), 3348 (1996).
15. J. Pierre, F. Robaut, S. Misat, P. Strobel, A. Nossov, V. Ustinov, and V. Vassiliev, Physica B 225, 214 (1996).
16. A. K. Cheetham, C. N. R. Rao, and T. Vogt, J. Solid State Chem. 126, 337 (1996).
17. M. Hervieu, G. Van Tendeloo, C. Caignaert, A. Maignan, and B. Raveau, Phys. Rev. B 53, 14274 (1996).
18. C. N. R. Rao and A. K. Cheetham, Science 272, 369 (1996).
19. W. Archibald, J. Zhou, and J. B. Goodenough, Phys. Rev. B 53 (21), 14445 (1996).
20. A. Asamitsu, Y. Moritomo, R. Kumai, Y. Tomioka, and Y. Tokura, Phys. Rev. B 54 (3), 1716 (1996).
21. P. G. Radaelli, M. Marezio, H. Y. Hwang, S-W. Cheong, and B. Batlogg, Phys. Rev. B 54, 8992 (1996).
22. M. Vereist, N. Rangavittal, C. N. R. Rao, and A. Rousset, J. Solid State Chem. 104, 74 (1993).
23. H. L. Yakel, Jr., Acta Crystallogr. 8, 394 (1955).
24. G. Turilli and F. Licci, Phys. Rev. B 54 (18), 13052 (1996).
25. M. McCormack, S. Jin, T. H. Tiefel, R. M. Fleming, J. M. Philips, and R. Ramesh, Appl. Phys. Lett. 64 (22), 3045 (1994).
26. G. C. Xiaong, Q. Li, L. Ju, S. N. Mao, L. Senapati, X. X. Xi, R. L. Greene, and T. Venkatesan, Appl. Phys. Lett. 66, 1427 (1995).
27. Y. Q. Li, J. Zhang, S. Pombrick, S. DiMiascio, W. Steven, Y. F. Yan, and N. P. Ong, J. Mater. Res. 10, 2166 (1995).
28. S-Y. Bae and S. X. Wang, Appl. Phys. Lett. 69 (1), 121 (1996).
29. X. T. Zeng and H. K. Wong, IEEE Trans. (Magnetics) 31 (6), 3910 (1995).
30. V. S. Achutharaman, P. A. Kraus, V. A. Vas'ko, C. A. Nordman, and A. M. Goldman, Appl. Phys. Lett. 67 (7), 1019 (1995).
31. J. O'Donnell, M. Onellion, M. S. Rzchowski, J. N. Eckstein, and I. Bozovic, Phys. Rev. B 54 (10), R6841 (1996).
32. J. N. Eckstein, I. Bozovic, J. O'Donnell, M. Onellion, and M. S. Rzchowski, Appl. Phys. Lett. 69, 1312 (1996).
33. A. R. Modak and K. M. Krishnan, J. Appl. Phys. 79, 5169 (1996).
34. K. A. Thomas, et al. (unpublished).
35. T. J. B. Holland and S. A. T. Redfern, J. Appl. Crystallogr. 30, 84 (1997).
36. W. Kraus and G. Nolze, J. Appl. Crystallogr. 29, 301 (1996).
37. J. S. Horwitz, P. C. Dorsey, N. C. Koon, M. Rubinstein, J. M. Bayers, D. J. Gillespie, M. S. Osofsky, V. G. Harris, K. S. Grabowski, D. L. Knies, E. P. Danovan, R. E. Treece, and D. B. Chrisey, in Epitaxial Oxide Thin Films II, edited by J. S. Speck, D. K. Fork, R. W. Wolf, and T. Shiosaki (Mater. Res. Soc. Symp. Proc. 401, Pittsburgh, PA, 1996), p. 525.