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Volumn 78, Issue 2, 1998, Pages 143-153

Pattern formation in thin-film failure

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIVE STRESS; COMPUTER SIMULATION; CRACK PROPAGATION; CRACKS; DELAMINATION; FAILURE (MECHANICAL); STRESS RELIEF; TENSILE STRESS; THIN FILMS;

EID: 0032140250     PISSN: 13642812     EISSN: None     Source Type: Journal    
DOI: 10.1080/13642819808202935     Document Type: Article
Times cited : (4)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.