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Volumn 78, Issue 2, 1998, Pages 143-153
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Pattern formation in thin-film failure
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPRESSIVE STRESS;
COMPUTER SIMULATION;
CRACK PROPAGATION;
CRACKS;
DELAMINATION;
FAILURE (MECHANICAL);
STRESS RELIEF;
TENSILE STRESS;
THIN FILMS;
PATTERN FORMATION;
THIN SOLID FILM;
FRACTURE MECHANICS;
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EID: 0032140250
PISSN: 13642812
EISSN: None
Source Type: Journal
DOI: 10.1080/13642819808202935 Document Type: Article |
Times cited : (4)
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References (22)
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