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Volumn 11, Issue 8, 1998, Pages 777-780
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High temperature XRD on silver sheathed Bi(Pb)-2223 tapes in different oxygen partial pressures
a,b c a a b
a
SIEMENS AG
(Germany)
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Author keywords
[No Author keywords available]
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Indexed keywords
BISMUTH COMPOUNDS;
COMPOSITION EFFECTS;
CRYSTAL GROWTH;
CRYSTALLIZATION;
OXIDE SUPERCONDUCTORS;
OXYGEN;
PARTIAL PRESSURE;
SILVER;
THERMAL EFFECTS;
X RAY CRYSTALLOGRAPHY;
SUPERCONDUCTING TAPES;
SUPERCONDUCTING DEVICES;
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EID: 0032140234
PISSN: 09532048
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-2048/11/8/011 Document Type: Article |
Times cited : (13)
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References (15)
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