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Volumn 191, Issue 4, 1998, Pages 734-739

Optical monitoring of the growth rate reduction by CCl4 during metalorganic vapour-phase epitaxy deposition of carbon doped GaAs

Author keywords

[No Author keywords available]

Indexed keywords

CARBON TETRACHLORIDE; COMPOSITION EFFECTS; ETCHING; METALLORGANIC VAPOR PHASE EPITAXY; MICROSCOPIC EXAMINATION; MORPHOLOGY; REFLECTOMETERS; REFRACTIVE INDEX; SEMICONDUCTOR DOPING; SEMICONDUCTOR GROWTH; THERMAL EFFECTS;

EID: 0032139159     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(98)00384-4     Document Type: Article
Times cited : (13)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.