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Volumn 191, Issue 4, 1998, Pages 734-739
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Optical monitoring of the growth rate reduction by CCl4 during metalorganic vapour-phase epitaxy deposition of carbon doped GaAs
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Author keywords
[No Author keywords available]
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Indexed keywords
CARBON TETRACHLORIDE;
COMPOSITION EFFECTS;
ETCHING;
METALLORGANIC VAPOR PHASE EPITAXY;
MICROSCOPIC EXAMINATION;
MORPHOLOGY;
REFLECTOMETERS;
REFRACTIVE INDEX;
SEMICONDUCTOR DOPING;
SEMICONDUCTOR GROWTH;
THERMAL EFFECTS;
REFLECTOMETRIC SIGNAL;
SEMICONDUCTING GALLIUM ARSENIDE;
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EID: 0032139159
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(98)00384-4 Document Type: Article |
Times cited : (13)
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References (12)
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