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Journal of Crystal Growth

Volumn 191, Issue 4, 1998, Pages 679-684

Optical characteristics of ZnCdSe/ZnSSe single quantum wells

(5) Tsukamoto, Hironori a Tamamura, Kohshi a Nagai, Masaharu a Hiei, Futoshi a Ikeda, Masao a

a SONY CORPORATION (Japan)

Author keywords

Critical thickness; II VI compound semiconductor; PL measurement; Single quantum well (SQW); ZnCdSe; ZnSSe

Indexed keywords

COMPOSITION EFFECTS; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING ZINC COMPOUNDS; STRAIN;

CRITICAL THICKNESS;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0032138630 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-0248(98)00380-7 Document Type: Article

Times cited : (2)

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