Effect of logic family on radiated emissions from digital circuits

IEEE Transactions on Electromagnetic Compatibility

Volumn 40, Issue 3, 1998, Pages 288-293

  Robinson, M P ^a   Benson, T M ^b   Christopoulos, C ^b   Dawson, J F ^a   Ganley, M D ^a   Marvin, A C ^a   Porter, S J ^a   Thomas, D W P ^b   Turner, J D ^c  

^a UNIVERSITY OF YORK   (United Kingdom)

^b UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^c NONE

Author keywords

Digital circuits; Electromagnetic compatibility; Electromagnetic interference; Logic circuits; Radiated emissions

Indexed keywords

CMOS INTEGRATED CIRCUITS; DIGITAL CIRCUITS; ELECTROMAGNETIC WAVE EMISSION; ELECTROMAGNETIC WAVE INTERFERENCE; ELECTROMAGNETIC WAVE PROPAGATION; LOGIC CIRCUITS;

TRANSIENT SWITCHING CURRENTS;

ELECTROMAGNETIC COMPATIBILITY;

EID: 0032138335     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/15.709429     Document Type: Article

References (8)

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