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Thin Solid Films

Volumn 327-329, Issue 1-2, 1998, Pages 262-267

Dependence of the measured monolayer height on applied forces in scanning force microscopy

(4) Hartig, M a Chi, L F a Liu, X D a Fuchs, H a

a UNIVERSITY OF MÜNSTER (Germany)

Author keywords

Elastic deformation; Langmuir Blodgett monolayers; Scanning force microscopy

Indexed keywords

CRYSTAL DEFECTS; DEFORMATION; ELASTICITY; FILM PREPARATION; MICROSCOPIC EXAMINATION; MONOLAYERS; THICKNESS MEASUREMENT;

SCANNING FORCE MICROSCOPY (SFM); SELF-ASSEMBLED MONOLAYERS (SAM);

LANGMUIR BLODGETT FILMS;

EID: 0032138036 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(98)00641-5 Document Type: Article

Times cited : (16)

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