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Volumn 411, Issue 3, 1998, Pages 286-293

NEXAFS studies of adsorption of benzene on Si(100)-2 x 1

(4) Kong, Maynard J a Teplyakov, Andrew V a Lyubovitsky, Julia G a Bent, Stacey F a,b

Author keywords

Aromatics; Chemisorption; Infrared absorption spectroscopy; Near edge X ray absorption fine structure (NEXAFS); Physical adsorption; Silicon; Single crystal surfaces; Surface chemical reaction

Indexed keywords

ABSORPTION SPECTROSCOPY; ADDITION REACTIONS; ADSORPTION; BENZENE; CHEMICAL BONDS; CHEMISORPTION; MOLECULAR STRUCTURE; MOLECULAR VIBRATIONS; SINGLE CRYSTALS;

DIELS-ALDER ADDITION REACTION; NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURE (NEXAFS);

SEMICONDUCTING SILICON;

EID: 0032137977 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(98)00336-7 Document Type: Article

Times cited : (111)

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