Statistical method for the identification of peak movement in spectral data: Application to x-ray diffraction patterns of manganese oxyhydroxides

Measurement Science and Technology

Volumn 9, Issue 8, 1998, Pages 1239-1246

  Jones, J C ^a   Maskell, W C ^a   Tye, F L ^a  

^a MIDDLESEX UNIVERSITY   (United Kingdom)

Author keywords

Manganese oxyhydroxide; Peak movement; Spectra; Statistical analysis; X ray diffraction

Indexed keywords

MANGANESE COMPOUNDS; REGRESSION ANALYSIS; X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY;

MANGANESE OXYHYDROXIDES; PEAK MOVEMENT IDENTIFICATION;

SPECTRUM ANALYSIS;

EID: 0032137920     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/9/8/016     Document Type: Article

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