Simulated annealing based pattern classification

Information Sciences

Volumn 109, Issue 1-4, 1998, Pages 165-184

  Bandyopadhyay, Sanghamitra ^a   Pal, Sankar K ^a   Murthy, C A ^b  

^a INDIAN STATISTICAL INSTITUTE   (India)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

Bayes error probability; Evolutionary computation; Genetic algorithm; Pattern recognition

Indexed keywords

COMPUTATIONAL METHODS; DECISION THEORY; ERROR ANALYSIS; GENETIC ALGORITHMS; NEURAL NETWORKS; PIECEWISE LINEAR TECHNIQUES; PROBABILITY; SIMULATED ANNEALING;

BAYES ERROR PROBABILITY; EVOLUTIONARY COMPUTATION;

PATTERN RECOGNITION;

EID: 0032137160     PISSN: 00200255     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0020-0255(98)00017-6     Document Type: Article

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