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Volumn 278, Issue 1-2, 1998, Pages 1-5
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Unusual electrical resistivity anomalies of thulium thin films at low temperatures
a b c |
Author keywords
Electrical resistivity; Low temperatures; Thulium thin films; X ray diffraction
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Indexed keywords
CRYSTAL ORIENTATION;
ELECTRIC CONDUCTIVITY MEASUREMENT;
THERMAL EFFECTS;
THIN FILMS;
THULIUM;
X RAY CRYSTALLOGRAPHY;
RESIDUAL RESISTIVITY RATIO;
METALLIC FILMS;
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EID: 0032136406
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-8388(98)00259-X Document Type: Article |
Times cited : (6)
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References (20)
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