The optical properties of the BigBite spectrometer at NIKHEF

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 412, Issue 2-3, 1998, Pages 254-264

  De Lange, D J J ^a   Blok, H P ^a,b   Boersma, D J ^a,c   Botto, T ^a   Heimberg, P ^a,b   Higinbotham, D W ^d   Passchier, I ^a   Van Sambeek, M J M ^a,b   Six, E ^e   Steenbakkers, M F M ^a,b   Steijger, J J M ^a   De Vries, H ^a  

^a NIKHEF   (Netherlands)

^b VU UNIVERSITY AMSTERDAM   (Netherlands)

^c UTRECHT UNIVERSITY   (Netherlands)

^d UNIVERSITY OF VIRGINIA   (United States)

^e ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Electron scattering; Electron spectrometer; Magnetic spectrometer; Magneto optics; Targets

Indexed keywords

ACCELERATOR MAGNETS; APPROXIMATION THEORY; DRIFT CHAMBERS; ELECTRON SCATTERING; MAGNETOOPTICAL EFFECTS; MATRIX ALGEBRA; PARTICLE BEAM TRACKING; POSITION MEASUREMENT; TARGETS;

ELECTRON SPECTROMETERS; MAGNETIC SPECTROMETERS;

PARTICLE SPECTROMETERS;

EID: 0032136176     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)00476-8     Document Type: Article

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