Characterisation of doped-lanthanum gallates by X-ray diffraction and Raman spectroscopy

Solid State Ionics

Volumn 111, Issue 1-2, 1998, Pages 1-7

  Sammes, N M ^a,b   Tompsett, G A ^b   Phillips, R J ^b   Cartner, A M ^b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b UNIVERSITY OF WAIKATO   (New Zealand)

Author keywords

Lanthanum gallate; Lattice parameters; Raman spectroscopy; X ray diffraction

Indexed keywords

DOPING (ADDITIVES); LATTICE CONSTANTS; RAMAN SPECTROSCOPY; SYNTHESIS (CHEMICAL); X RAY CRYSTALLOGRAPHY;

LANTHANUM GALLATES;

LANTHANUM COMPOUNDS;

EID: 0032132263     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0167-2738(98)00162-3     Document Type: Article

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