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Volumn 38, Issue 8, 1998, Pages 1199-1213

Behaviour of electron density profiles and particle transport analysis in the RFX reversed field pinch

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRON TRANSPORT PROPERTIES; INTERFEROMETERS; MAGNETIC FIELDS; PINCH EFFECT; PLASMA CONFINEMENT; PLASMA DENSITY; PLASMA SIMULATION; RANDOM PROCESSES; THERMAL GRADIENTS;

EID: 0032131710     PISSN: 00295515     EISSN: None     Source Type: Journal    
DOI: 10.1088/0029-5515/38/8/307     Document Type: Article
Times cited : (57)

References (30)
  • 14
    • 34250532863 scopus 로고
    • LOTZ, W., Z. Phys. 216 (1968) 241.
    • (1968) Z. Phys. , vol.216 , pp. 241
    • Lotz, W.1
  • 16
    • 0004285677 scopus 로고
    • Chapman and Hall, London
    • THORNE, A., Spectrophysics, Chapman and Hall, London (1974).
    • (1974) Spectrophysics
    • Thorne, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.