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Volumn 47, Issue 4, 1998, Pages 839-848

Testing an ADC linearized with pseudorandom dither

Author keywords

Analog digital conversion; Dither techniques; Harmonic distortion; Measurement errors; Nonlinear distortion; Radar clutter; Radar testing

Indexed keywords

BANDWIDTH; ERROR ANALYSIS; HARMONIC ANALYSIS; MEASUREMENT ERRORS; RADAR CLUTTER; RANDOM PROCESSES; SIGNAL DISTORTION; SPURIOUS SIGNAL NOISE;

EID: 0032131113     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.744631     Document Type: Article
Times cited : (13)

References (4)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.