Water-induced degradation of chromium fluoride films

Thin Solid Films

Volumn 324, Issue 1-2, 1998, Pages 292-299

  Kim, Eunah ^a   Hong, Seungbum ^a   Gorman, John David ^b   Lim, Sungchul ^c   Moon, Seong Yong ^a   Kim, Dae Weon ^a   No, Kwangsoo ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b RMIT UNIVERSITY   (Australia)

^c SAMSUNG Electronics   (South Korea)

Author keywords

Chromium fluoride; Rutherford backscattering spectroscopy; X ray photoelectron spectroscopy

Indexed keywords

CHEMICAL BONDS; CHROMIUM COMPOUNDS; DEGRADATION; PERCOLATION (FLUIDS); POROUS MATERIALS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; WATER; X RAY PHOTOELECTRON SPECTROSCOPY;

CHROMIUM FLUORIDE; HYDROXIDES;

OPTICAL FILMS;

EID: 0032124231     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)01023-7     Document Type: Article

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