Application of ATR-FTIR spectroscopy combined with sputter etching for depth profiling of a chemical additive within a pulp fiber

Journal of Applied Polymer Science

Volumn 69, Issue 3, 1998, Pages 461-468

  Tatsumi, Daisuke ^a   Yamauchi, Tatsuo ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

Depth profiling; Fibers; Infrared spectroscopy; Pulp additives; Sputter etching

Indexed keywords

ETCHING; FOURIER TRANSFORM INFRARED SPECTROSCOPY; NATURAL FIBERS; PULP;

ATTENUATED TOTAL REFLECTION FOURIER TRANSFORM INFRARED SPECTROSCOPY; DEPTH PROFILING; SPUTTER ETCHING;

ADDITIVES;

EID: 0032124112     PISSN: 00218995     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1097-4628(19980718)69:3<461::aid-app5>3.0.co;2-e     Document Type: Article

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