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Volumn 133, Issue 3, 1998, Pages 205-212

An XPS study of SrS:Ce thin films for electroluminescent devices

Author keywords

Cerium; Chemical state; Electroluminescence; Strontium sulfide; Thin films; X ray photoelectron spectroscopy (XPS)

Indexed keywords

CERIUM; CRYSTAL ORIENTATION; DOPING (ADDITIVES); ELECTROLUMINESCENCE; EPITAXIAL GROWTH; FLUORESCENCE; STRONTIUM COMPOUNDS; SUBSTRATES; SURFACE STRUCTURE; THIN FILMS; X RAY CRYSTALLOGRAPHY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0032123971     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00199-8     Document Type: Article
Times cited : (38)

References (36)
  • 5
    • 0346631826 scopus 로고
    • M. Tiitta, L. Niinistö, Chem. Vap. Deposition 3 (1997) 167. (1994) 151.
    • (1994) Chem. Vap. Deposition , pp. 151
  • 29
    • 0346000781 scopus 로고    scopus 로고
    • Joint Committee of Powder Diffraction Standards, Card 8-489
    • Joint Committee of Powder Diffraction Standards, Card 8-489.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.