High resolution chemical mapping in the energy-filtering TEM: Application to interface layers in ceramics

Thin Solid Films

Volumn 324, Issue 1-2, 1998, Pages 170-175

  Ponsonnet, L ^a   Vacher, B ^a   Martin, J M ^a  

^a LABORATOIRE DE TRIBOLOGIE ET DYNAMIQUE DES SYSTÈMES   (France)

Author keywords

Ceramics; Chemical mapping; Image spectrum electron energy loss spectroscopy

Indexed keywords

CERAMIC MATERIALS; IMAGING SYSTEMS; INTERFACES (MATERIALS); THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

CHEMICAL MAPPING; IMAGING FILTERS;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 0032123817     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)00361-7     Document Type: Article

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