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Volumn 13, Issue 7, 1998, Pages 1950-1955
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Solid-phase reactions in Ir/(111)Si systems studied by means of x-ray emission spectroscopy
a a a b b b c c |
Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
ELECTRON BEAMS;
ELECTRON ENERGY LEVELS;
EMISSION SPECTROSCOPY;
IRIDIUM ALLOYS;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
THERMAL EFFECTS;
X RAY SPECTROSCOPY;
SOLID PHASE REACTIONS;
METALLIC FILMS;
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EID: 0032123098
PISSN: 08842914
EISSN: None
Source Type: Journal
DOI: 10.1557/JMR.1998.0274 Document Type: Article |
Times cited : (5)
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References (11)
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