Propagation loss measurements in semiconductor microcavity ring and disk resonators

Journal of Lightwave Technology

Volumn 16, Issue 7, 1998, Pages 1308-1313

  Rafizadeh, D ^a,b   Zhang, J P ^c   Tiberio, R C ^d   Ho, S T ^c  

^a NORTHWESTERN UNIVERSITY   (United States)

^b AEROSPACE CORPORATION   (United States)

^c Northwestern University   (United States)

^d Department of Theoretical and Applied Mechanics and the Cornell Nanofabrication Facility   (United States)

Author keywords

Integrated optics; Loss measurement; Microresonators; Optical device fabrication; Optical filters; Optical waveguides

Indexed keywords

ELECTRIC FIELD MEASUREMENT; ELECTRIC LOSS ANGLE MEASUREMENT; INTEGRATED OPTICS; MAGNETIC FIELD MEASUREMENT; OPTICAL FILTERS; OPTICAL RESONATORS; OPTICAL WAVEGUIDES; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE;

SEMICONDUCTOR MICROCAVITY RING; TRANSVERSE ELECTRIC (TE) MODE; TRANSVERSE MAGNETIC (TM) MODE;

LIGHT PROPAGATION;

EID: 0032122945     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/50.701410     Document Type: Article

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