New results and trends in the solid phase recrystallization of ZnSe

Materials Letters

Volumn 36, Issue 1-4, 1998, Pages 162-166

  Lemasson, P ^a   Ndap, J O ^a   Fusil, S ^a   Riviere A ^a   Qu'hen, B ^a   Lusson, A ^a   Neu, G ^b   Tournie E ^b   Geoffroy, G ^c   Zozime, A ^a   Triboulet, R ^a  

^a CNRS   (France)

^b CRHEA CNRS   (France)

^c LABORATOIRE DES SOLIDES IRRADIÉS   (France)

Author keywords

Solid phase recrystallization; X ray diffraction; ZnSe

Indexed keywords

ACTIVATION ENERGY; CRYSTAL DEFECTS; CRYSTAL GROWTH; CRYSTAL IMPURITIES; CRYSTAL ORIENTATION; CRYSTALLIZATION; LATTICE CONSTANTS; PHOTOLUMINESCENCE; RAMAN SCATTERING; SCANNING ELECTRON MICROSCOPY; TWINNING; X RAY CRYSTALLOGRAPHY;

SOLID PHASE RECRYSTALLIZATION (SPR);

SEMICONDUCTING ZINC COMPOUNDS;

EID: 0032122135     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(98)00020-2     Document Type: Article

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