Interface Madelung constants for isoelectronic impurities: Generalized Madelung constants

Journal of Crystal Growth

Volumn 191, Issue 1-2, 1998, Pages 143-147

  Sohn, S H ^a  

^a Kyungpook National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL IMPURITIES; ELECTRON ENERGY LEVELS; INTERFACES (MATERIALS); IONS;

EVJEN METHOD; GENERALIZED MADELUNG CONSTANTS; IONIC CRYSTALS;

CRYSTALS;

EID: 0032121801     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(98)00023-2     Document Type: Article

References (14)

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13. i(j)'s are calculated by a personal computer in such a way as the sum over neighboring shells.
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