Time-of-flight spectrometry applied to 2 MeV He RBS

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 142, Issue 3, 1998, Pages 417-424

  Dobeli M ^a   Ender, R M ^b   Liechtenstein, V ^c   Vetterli, D ^b  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b ETH ZURICH   (Switzerland)

^c RRC 'Kurchatow Institute'   (Russian Federation)

Author keywords

Diamond like carbon (DLC); Energy straggling; Rutherford backscattering; Time of flight spectrometer

Indexed keywords

DIAMOND FILMS; HELIUM; OXYGEN; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON;

ENERGY STRAGGLING; FULL WIDTH AT HALF MAXIMUM (FWHM); TANDEM EFFECTS;

PARTICLE DETECTORS;

EID: 0032121186     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)00280-8     Document Type: Article

References (5)

1. J.P. Coffin, P. Engelstein, Treatise on Heavy Ion Science, in: D.A. Bromley (Ed.), vol. 7, chap. 7, Plenum Press, New York, 1985.
2. W.K. Chu, J.W. Mayer, M.A. Nicolet, Backscattering Spectrometry, Academic Press, New York, 1978.
3. M. Döbeli, A. Lombao, D. Vetterli, M. Suter, Nucl. Instr. and Meth. B 89 (1994) 174.
4. V.K. Liechtenstein, T.M. Ivkova, E.D. Olshanski, I. Feigenbaum, R. DiNardo, M. Döbeli, Nucl. Instr. and Meth. A 397 (1997) 140.
5. L.R. Doolittle, Nucl. Instr. and Meth. B 15 (1986) 227.