Near-field optical spectroscopy of self-assembled quantum dots: NSOM apparatus for measuring the features of single dots

Solid-State Electronics

Volumn 42, Issue 7-8, 1998, Pages 1083-1086

  Toda, Y ^a   Shinomori, S ^a   Suzuki, K ^a   Arakawa, Y ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL MICROSCOPY; PHOTOLUMINESCENCE; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR GROWTH; SPECTROMETERS; SUPERCONDUCTING MAGNETS;

NEAR-FIELD OPTICAL SPECTROSCOPY; SELF-ASSEMBLED QUANTUM DOTS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 0032120969     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(97)00306-7     Document Type: Article

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