High sensitivity precision relative intensity noise calibration standard using low noise reference laser source

IEE Proceedings: Science, Measurement and Technology

Volumn 145, Issue 4, 1998, Pages 163-165

  Cox, M C ^a   Copner, N J ^a   Williams, B ^a  

^a DEFENCE SCIENCE AND TECHNOLOGY LABORATORY   (United Kingdom)

Author keywords

Laser diodes; Measurement standards; Relative intensity noise

Indexed keywords

CALIBRATION; LIGHT INTERFERENCE; PHOTOCURRENTS;

RELATIVE INTENSITY NOISE (RIN);

SEMICONDUCTOR LASERS;

EID: 0032120801     PISSN: 13502344     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-smt:19982098     Document Type: Article

References (9)

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5. JOINDOT, I.: 'Measurements of relative intensity noise (RIN) in semiconductor lasers', J. Phys., 2 September 1992, III
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9. HEWLETT PACKARD, : 'RF, microwave and lightwave measurement.' Symposium and exhibition on Receiver design for accurate lightwave measurements, 1991