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Volumn 22, Issue 3, 1998, Pages 141-152

Development of a fast mechanical probe for coordinate measuring machines

Author keywords

High speed probing; Impact damage; Mechanical probe; Optical measurement system; Probe tip bouncing

Indexed keywords

IMPACT TESTING; MEASUREMENT ERRORS; OPTICAL INSTRUMENTS; PRECISION ENGINEERING;

EID: 0032120742     PISSN: 01416359     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0141-6359(98)00008-7     Document Type: Article
Times cited : (46)

References (11)
  • 2
    • 0021617046 scopus 로고
    • The investigation on selected dynamical phenomena in the heads of multicoordinate measuring devices
    • Nawara, L. and Kowalski, M. "The investigation on selected dynamical phenomena in the heads of multicoordinate measuring devices," Ann CIRP, 1984, 33, 373-375
    • (1984) Ann CIRP , vol.33 , pp. 373-375
    • Nawara, L.1    Kowalski, M.2
  • 5
    • 0029706572 scopus 로고    scopus 로고
    • Accuracy limitations of fast mechanical probing
    • Vliet, W. P. van "Accuracy limitations of fast mechanical probing," Ann CIRP, 1996, 45, 483-487
    • (1996) Ann CIRP , vol.45 , pp. 483-487
    • Van Vliet, W.P.1
  • 6
    • 85040875608 scopus 로고
    • New York: Cambridge University Press
    • Johnson, K. L. Contact Mechanics. New York: Cambridge University Press, 1985
    • (1985) Contact Mechanics
    • Johnson, K.L.1
  • 11
    • 22244460738 scopus 로고    scopus 로고
    • Ögärdesvägen, Partille, Sweden: SiTek Electro Optics AB
    • SiTek Electro Optics. PSD User's Manual, version J-305. Ögärdesvägen, Partille, Sweden: SiTek Electro Optics AB
    • PSD User's Manual, Version J-305


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.