Proximity effects of the vacuum and substrate on the behavior of ultrathin epilayers

Interface Science

Volumn 6, Issue 3, 1998, Pages 225-233

  Van Der Merwe, J H ^a  

^a UNIVERSITY OF SOUTH AFRICA   (South Africa)

Author keywords

Embedded atom quantification; Ultrathin epilayers; Vacuum and substrate proximity effects

Indexed keywords

COMPRESSIVE STRESS; CRYSTALLIZATION; DISLOCATIONS (CRYSTALS); FILM GROWTH; GRAIN BOUNDARIES; MONOLAYERS; CRYSTAL ATOMIC STRUCTURE; CRYSTAL DEFECTS; CRYSTAL LATTICES; ELASTICITY; EPITAXIAL GROWTH; INTERFACES (MATERIALS); MATHEMATICAL MODELS; POLYCRYSTALS; SUBSTRATES;

EMBEDDED-ATOM QUANTIFICATION; INTERACTION ENERGY; ULTRATHIN EPILAYERS; VACUUM AND SUBSTRATE PROXIMITY EFFECTS; EMBEDDED ATOM QUANTIFICATION; PROXIMITY PHENOMENA;

ULTRATHIN FILMS;

EID: 0032120654     PISSN: 09277056     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008668319765     Document Type: Article

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