Computation of photoelectron and Auger-electron diffraction III. Evaluation of angle-resolved intensities PAD3

Computer Physics Communications

Volumn 112, Issue 1, 1998, Pages 91-101

  Chen, X ^a   Harp, G R ^a,b   Ueda, Y ^a   Saldin, D K ^a  

^a UNIVERSITY OF WISCONSIN MILWAUKEE   (United States)

^b OHIO UNIVERSITY   (United States)

Author keywords

Angle resolved; Auger; Core level; Electron diffraction; Electron spectroscopy; Multiple scattering; Photoelectron; Surface structure

Indexed keywords

ALGORITHMS; AUGER ELECTRON SPECTROSCOPY; COMPUTATIONAL METHODS; COMPUTER SOFTWARE; ELECTRON SCATTERING; MATRIX ALGEBRA; PHOTOELECTRON SPECTROSCOPY;

CONCENTRIC SHELL ALGORITHMS (CSA); MULTIPLE SCATTERING; SOFTWARE PACKAGE PAD3;

ELECTRON DIFFRACTION;

EID: 0032120060     PISSN: 00104655     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0010-4655(98)00032-0     Document Type: Article

References (5)

1. See, e.g., X. Chen, G.R. Harp, D.K. Saldin, J. Vac. Sci. Technol. A 12 (1994) 428.
2. D.K. Saldin, G.R. Harp, X. Chen, Phys. Rev. B 48 (1993) 8234.
3. V. Fritzsche, J. Phys. Condens. Matter 2 (1990) 1413; 2 (1990) 9735.
4. V. Fritzsche, J. Phys. Condens. Matter 2 (1990) 1413; 2 (1990) 9735.
5. X. Chen, D.K. Saldin, Comput. Phys. Commun. 112 (1998) 67, paper I.