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Volumn 4, Issue 4, 1998, Pages 129-132

Low-Temperature Thermal CVD of Ti-Al Metal Films Using a Strong Reducing Agent

Author keywords

[No Author keywords available]

Indexed keywords

AGENTS; ASPECT RATIO; LOW TEMPERATURE OPERATIONS; METALLIC FILMS; REDUCTION; TITANIUM; TITANIUM COMPOUNDS;

EID: 0032119697     PISSN: 09481907     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1521-3862(199807)04:04<129::aid-cvde129>3.3.co;2-a     Document Type: Article
Times cited : (7)

References (16)
  • 12
    • 0003459529 scopus 로고
    • Perkin-Elmer Corporation, Physical Electronics Division, Norwalk, CT
    • Handbook of X-ray Photoelectron Spectroscopy (Ed. J. Chastin), Perkin-Elmer Corporation, Physical Electronics Division, Norwalk, CT, 1992.
    • (1992) Handbook of X-ray Photoelectron Spectroscopy
    • Chastin, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.