An investigation of stellite-6 alloy containing 5.0 wt% silicon

Journal of Materials Processing Technology

Volumn 79, Issue 1-3, 1998, Pages 47-51

  Kuzucu, V ^a   Ceylan, M ^a   Celik H ^a   Aksoy, I ^b  

^a FIRAT UNIVERSITY   (Turkey)

^b INONU UNIVERSITY   (Turkey)

Author keywords

Carbides; Microstructure; Silicon; Stellite 6; X ray diffraction

Indexed keywords

ANNEALING; CARBIDES; DIFFERENTIAL SCANNING CALORIMETRY; EUTECTICS; HARDNESS TESTING; INTERMETALLICS; MARTENSITIC TRANSFORMATIONS; METALLOGRAPHIC MICROSTRUCTURE; MICROSCOPIC EXAMINATION; SILICON COMPOUNDS; SOLIDIFICATION; X RAY DIFFRACTION ANALYSIS;

STELLITE 6 ALLOY;

COBALT ALLOYS;

EID: 0032119150     PISSN: 09240136     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-0136(97)00452-4     Document Type: Article

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