Shot noise in double barrier structures

Solid-State Electronics

Volumn 42, Issue 7-8, 1998, Pages 1515-1521

  Isawa, Yoshimasa ^a   Matsubara, Noriaki ^a   Ohuti, Takaharu ^b  

^a HIROSHIMA UNIVERSITY   (Japan)

^b TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRON TUNNELING; SEMICONDUCTOR DEVICE MODELS; SHOT NOISE;

DOUBLE BARRIER STRUCTURES (DBS); LESOVIK THEORY;

SEMICONDUCTOR DEVICE STRUCTURES;

EID: 0032118439     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(98)00062-8     Document Type: Article

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