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Japanese Journal of Applied Physics, Part 2: Letters

Volumn 37, Issue 7 PART A, 1998, Pages

Electric field-effect enhancement by a combination of coplanar high-TC superconducting devices with step-edge junctions

(3) Suzuki, Shigeru a Sugai, Satoshi a Oda, Shunri a

a Tokyo Institute of Technology ^* (Japan)

Author keywords

Coplanar; Electric field effect; Metalorganic chemical vapor deposition; MOCVD; Step edge; Superconducting field effect transistor; YBa2Cu3Ox

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FIELD EFFECTS; FIELD EFFECT TRANSISTORS; GRAIN BOUNDARIES; HIGH TEMPERATURE SUPERCONDUCTORS; LEAKAGE CURRENTS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OXIDE SUPERCONDUCTORS; YTTRIUM BARIUM COPPER OXIDES;

STEP-EDGE JUNCTIONS; SUPERCONDUCTING FIELD EFFECT TRANSISTORS;

SUPERCONDUCTING DEVICES;

EID: 0032118271 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.37.l784 Document Type: Article

Times cited : (1)

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