Electric field-effect enhancement by a combination of coplanar high-TC superconducting devices with step-edge junctions

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 37, Issue 7 PART A, 1998, Pages

  Suzuki, Shigeru ^a   Sugai, Satoshi ^a   Oda, Shunri ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Coplanar; Electric field effect; Metalorganic chemical vapor deposition; MOCVD; Step edge; Superconducting field effect transistor; YBa2Cu3Ox

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FIELD EFFECTS; FIELD EFFECT TRANSISTORS; GRAIN BOUNDARIES; HIGH TEMPERATURE SUPERCONDUCTORS; LEAKAGE CURRENTS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OXIDE SUPERCONDUCTORS; YTTRIUM BARIUM COPPER OXIDES;

STEP-EDGE JUNCTIONS; SUPERCONDUCTING FIELD EFFECT TRANSISTORS;

SUPERCONDUCTING DEVICES;

EID: 0032118271     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.l784     Document Type: Article

References (12)

1. J. Mannhart, J. G. Bednorz, K. A. Müller and D. G. Schlom: Z. Phys. B 83 (1991) 307.
2. X. X. Xi, Q. Li, C. Doughty, C. Kwon, S. Bhattacharya, A. T. Findikoglu and T. Venkatesan: Appl. Phys. Lett. 59 (1991) 3470.
3. T. Fujii, K. Sakuta, T. Awaji, K. Matsui, T. Hirano, Y. Ogawa and T. Kobayashi: Jpn. J. Appl. Phys. 31 (1992) L612.
4. J. Mannhart, J. Ströbel, J. G. Bednorz and Ch. Gerber: Appl. Phys. Lett. 62 (1993) 630.
5. Z. G. Ivanov, E. A. Stepantov, A. Ya Tzalenchuk, R. I. Shekhter and T. Claeson: IEEE Trans. Supercond. 3 (1993) 2925.
6. K. Nakajima, K. Yokota, H. Myoren, J. Chen and T. Yamashita: Appl. Phys. Lett. 63 (1993) 684.
7. K. Petersen, I. Takeuchi, V. Talyansky, C. Doughty, X. X. Xi and T. Venkatesan: Appl. Phys. Lett. 67 (1995) 1477.
8. S. Suzuki and S. Oda: Physica C 282-287 (1997) 2495.
9. S. Suzuki, H. Tobisaka and S. Oda: Jpn. J. Appl. Phys. 37 (1998) 492.
10. H. Zama, J. Saga, T. Hattori and S. Oda: Jpn. J. Appl. Phys. 33 (1994) L312.
11. S. Oda, S. Yamamoto and A. Kawaguchi: J. Phys. IV (Paris) 5 (1995) Suppl. C5-379.
12. For example, K. P. Daly, W. D. Dozier, J. F. Burch, S. B. Coons, R. Hu, C. E. Platt and R. W. Simon: Appl. Phys. Lett. 58 (1991) 543.